ATC FIB/SEM Expands Capabilities To The Nano Scale Level
January 15, 2021
ATC’s Scios 2 DualBeam Laboratory
ATC introduced its new Dualbeam™ FIB/SEM capability today, accompanied by a staff with 30 years in FIB/SEM analysis and sample preparation. This new capability enhances the ATC position as a leader in Failure Analysis (FA), Destructive Physical Analysis (DPA), Prohibited Material Analysis (PMA) and Real Time ,3-D, Color X-Ray services.
